Wheat blossom midge(Sitodiplosis mosellana Gehin)is one of the most important pests in wheat, which has caused large losses for wheat production and grain quality. Genetic analysis of wheat resistance to midge based on Quantitative trait locus (QTL) mapping and linked markers has important implications for improving the selection efficiency in breeding midge-resistant wheat. In this study, with recombinant inbred lines(RILs) derived from susceptible and resistant wheat lines as materials, we mapped the QTLs of midge resistance and characterized the relevant inheritance in Wheat cultivar Jimai 24 by using SSR markers and artificial midge nursery. The results showed that resistance between lines 6218 and Jimai 24 are significantly different, and resistance scales among RIL lines are stable during two consecutive years. A linkage map was constructed with 124 SSR loci, which comprises 24 linkage groups. The total length of this map was 672.8cM, and the average distance among different markers was 6.6cM. Using the IciMapping package for inclusive composite interval QTLmapping QTL, a QTL(QSm.hbau-4A) with additive effects was identified on 4A chromosome. The phenotypic variance explained (PVE) of this locus in the two test years is 9.67% and 10.57%, respectively. The mapping of this QTL and the identification of its linked SSR markers will increase the selection efficiency for breeding midge-resistant lines or cultivars.